It’s not easy to characterize the loading conditions for a mechanical product. How do you decide the final testing specification to avoid over- or under-engineering? Real loading data is seldom available until late into the prototyping stage and everything can change if the dynamics of the system are modified.
A popular method of testing components or subsystems is to apply a PSD or swept sine profile to cover a wide range of frequencies with a shaker test. But the need to determine or verify these test specs with respect to real world data still remains.
The Accelerated Testing glyphs use “mission synthesis” techniques based on proven methods as described in standards such as GAM-EG-13 and NATO Draft Standard AECTP 200. By calculating shock response and fatigue damage spectra from known acceleration data, multiple events can be analyzed, combined and converted into a representative PSD or swept sine test specification. Input measured data can be in either time or frequency domains.
In this way, a test specification is defined which creates an equally damaging environment to the original data but can be run more quickly. Furthermore, statistical effects such as variability in loads or component strength, and the limited number of tests to be carried out, can be taken into account.
Mission synthesis generates a single testing profile from multiple loading environments – one that is ideal for sign-off tests.
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